MEES Seminar Series, Dr. ChaBum Lee, Tennessee Technical University, "Edge Diffraction-Utilized Precision Dimensional Sensing Technology"

March 2, 2017 - 12:30 PM to 1:30 PM
Duke 345
Department of Mechanical Engineering and Engineering Science, 704-687-8253

Edge Diffraction-Utilized Precision Dimensional Sensing Technology

Metrology, or the science of measurement, is essential in manufacturing. The phrase “if it can’t be measured, it can’t be manufactured” may be overused, but it remains true. There is a critical need for new dimensional metrology technology in advanced manufacturing. This metrology technology must be promising because the many sensing technology is dominated by three system architectures: 1) compact nanoscale sensors with 10’s to 100’s of micrometers range, 2) large scale sensors with moderate-to-high accuracy intended for ranges of 10’s to 1000’s of millimeters, and 3) low-cost sensors with wide bandwidth. I have created a novel dimensional sensing technique utilizing knife edge (OKE) diffraction as an alternative position sensor with compactness, high accuracy, and low cost. In this presentation, novel dimensional measurement techniques based on edge diffraction principle are introduced: 1) knife-edge sensors for nanopositioning stage applications, 2) curved-edge sensors for spindle applications, and 3) cutting tool wear monitoring sensors. The proposed sensors promise to be comparable to commercially available sensors, i.e. capacitive sensors, linear variable differential transformer, laser interferometers and optical linear encoders. Last, collaborative research between UNCC and Tennessee Tech Univ will be briefly introduced.

About the Speaker:

Dr. ChaBum Lee is a faculty member in the Department of Mechanical Engineering at Tennessee Technical University.  His areas of expertise are as follows:

•Precision Dimensional Metrology
•Optical Surface Metrology
•Optical Microscopy
•Spindle Metrology
•Cutting Tool Health Monitoring