Curriculum Vitae
ROBERT JOHN HOCKEN
FORMAL EDUCATION
NBS-NRC Postdoctoral Fellow, 1973-75
State University of New York at Stony Brook, 1973, Ph.D. Physics
State University of New York at Stony Brook, 1969, M.A. Physics
Oregon State University, 1968, B.A. Physics
Oregon State University, 1968, B.A. Mathematics
PERSONAL
Birth Date: February 20, 1944
Birth Place: Dinuba, California
PROFESSIONAL EXPERIENCE
National Institute of Standards and Technology (formerly National Bureau of Standards), Washington, DC,
Sept. 1973 - Dec. 1988
NBS-NRC Postdoctorate Fellow, Heat Division, September 1973 - March 1975
Physicist, Dimensional Technology Section, March 1975 - August 1976
Chief, Dimensional Technology Section, August 1976 - March 1979
Group Leader, Dimensional Metrology, Mechanical Processes Division, Center for Mechanical Engineering & Process
Technology, March 1979 – April 1980
Chief, Automated Production Technology Division, Center for Manufacturing Engineering, April 1980 - 1985
Chief, Precision Engineering Division, Center for Manufacturing Engineering, April 1985 - December 1988
University of North Carolina at Charlotte, Charlotte, NC 28223, December 1988 - Present
Norvin Kennedy Dickerson, Jr., Distinguished Professor of Precision Engineering
Director, Center for Precision Metrology
TEACHING EXPERIENCE
State University of New York at Stony Brook, Teaching Assistant,
1968-1973
State University of New York at Farmingdale, Instructor, 1969
New York City Community College at Brooklyn, Instructor, 1971
New York Institute of Technology, Instructor, 1972-1973
University of Maryland, Visiting Professor, 1982
University of Tianjin, China, Invited Lecturer, 1983
Cranfield Institute of Technology, Bedford, England, Visiting
Professor, 1985
University of North Carolina at Charlotte, Charlotte, NC,
Distinguished Professor, 1988 - Present
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UNIVERSITY AND COMMUNITY SERVICE
University:
Search Committee, Director Office of Research, 1997-98
Search Committee, Chair of Physics Department, 1997-98
Cameron Applied Research Center Committee, 1996-98
COE International Program Committee, 1995-97
ME & ES Faculty Search Committee, 1994-95; 1995-96
Undergraduate Curriculum Committee, 1994-95; 1995-96
College of Engineering Promotion and Tenure Committee, 1993-94,
1994-95
Chair, Search Committee, 1992-93, 1993-94
ME & ES Department Promotion and Tenure Committee, 1990
Standards Committees:
ASME B89.4 Committee, Performance Measures for Coordinate Measuring
Machines, 1982-present.
ASME B5.52 Committee, Performance Measures for CNC Machining Centers
and Lathes, 1990-present.
ASME B89 Main Committee, Dimensional Metrology, 1990-present.
ISO TC3 WG 10, Thermal Environment for Dimensional Measurement,
1995-98.
International Committees:
Chairman, American Delegation, CIRP, 1994, 1995
Chairman, Scientific Technical Committee "Q", CIRP, 1985
President, Scientific Technical Committee P, CIRP
US Statutory Chairman, CIRP, 1993
Professional Associations:
ASPE President, 2004
ASPE Scholarship Committee, 1996-98.
ASPE Board of Directors, 1996-98.
RESEARCH INTEREST AND EXPERTISE
Present research efforts include the areas of engineering
metrology, nanotechnology (concentrating on development of the
methodology for microscopic machines, sensors, and actuators),
electro-optical instrumentation (testing of a high-speed laser
tracking system for manufacturing applications, and inspection
systems for turbine blades and blisks), atomic force microscopy and
optical stethoscopy, and dimensional metrology for Computer Aided
Manufacturing (with efforts concentrating on advanced probes,
controllers, surface measurement systems, including CMMs).
SELECTED PUBLICATIONS
Authored over 80 publications including journal reports, featured
articles, and proceedings, including invited lectures and
presentations. A sample of recent publications:
REFEREED JOURNAL PUBLICATIONS
Wilhelm, Hocken, and Schwenke, “Task specific uncertainty in
coordinate measurement”, CIRP Annals, Vol 2, 2001
Hocken, Trumper and Wang, “Dynamics and Control of the UNCC
Sub-Atomic Measuring Machine”, CIRP Annals, Vol 1, 2001
Gao, Hocken, Patten and Lovingood, “Nano-machining instrument for
nano-cutting of brittle materials”, CIRP Annals, Vol 1, 2000.
Lucca, Chou, and Hocken, “Effect of tool edge geometry on the
nanometric cutting of Ge”, CIRP Annals, Vol 1, 1998.
Babu, U., Raja, J., Hocken, R., and Chen, K. “Sampling Methods and
Substitute Geometry Algorithms for Measuring Cylinders in a
Coordinate Measuring Machine,” Transactions of NAMRI/SME, Volume
XXV, pp. 353-358, 1997.
Boudreau, B.D., Raja, J., Hocken, R.J., Patterson, S.R., and Patten,
J. “Thermal Imaging with Near-field Microscopy,” Rev. Sci.
Instruments, Vol. 68, pp. 3096-3098, 1997.
Hocken, R., and Wilhelm, R., “Frontiers in Precision Manufacturing –
Metrology.” International Journal for Manufacturing Science and
Production, 1997.
Evans, C., Hocken, R., Estler, W., “Self-calibration: Reversal,
Redunancy, Error Separation and Absolute Testing,” Annals of the
CIRP, 45, 3, 1996.
Badami, V., Smith, S., Raja, J., and Hocken, R., “A Portable
Three-Dimensional Stylus Profile Measuring Instrument.” Precision
Engineering, 18, April/May, 1996.
Miller, J. Hocken, R., Smith, S., Harb, S., “X-Ray Calibrated
Tunneling System Utilizing a Dimensionally Stable Nanometric
Positioner.” Precision Engineering, 18, April/May, 1996.
Hocken, R.J. An American National Standard: Methods for Performance
Evaluation of Coordinate Measuring Machines, ANSI/ASME B89-4-1995,
Standard for ASME, 1995.
Holmes, M., Trumper, D., Hocken, R., “Atomic-Scale Precision Motion
Control Stage (The Angstrom Stage).” CIRP Annals, Vol. 44, January
1995.
Cloninger, T., Balasubramanian, S., Boudreau, B., Raja, J., and
Hocken, R., “A Simple Technique for Screening Near-field Probes,”
Ultramicroscopy, 57 (1995).
Miller, J., Hocken, R.J., Smith, S.T., and Harb, H., "X-Ray
Calibrated Tunneling System Utilizing a Dimensionally Stable
Nanometer Positioner." Elsevier Science, Inc.
Hocken, R., "How to Cope with On-Machine Measurement", Manufacturing
Engineering, Aug. 1993, pp 8-10.
Hocken, R., J. Raja, and U. Babu, "Sampling Issues In Coordinate
Metrology", Manufacturing Review, Dec. 1993, pp. 282-294
Williams M.E., Trumper D.L., and Hocken R., ”Magnetic Bearing Stage
for photolithography”, CIRP Annals, Vol 1, 1993
Hocken, R., et. al., An American National Standard Methods for
Performance Evaluation of Coordinate Measuring Machines ANSI/ASME
B89.1.12M-1985, March 1991.
Miller, J.A. and Hocken, R.J., "STM Bit Making on Highly Oriented
Pyrolytic Graphite: Initial Results", Journal of Applied Physics,
July 1990.
Zhang, G., Ouyang, R., Lu, B., Hocken, R., Veale, R., and Donmez,
A., "A Displacement method for Machine Geometry Calibration", CIRP
Annals, Vol. 1, 1988.
Hocken, R. and Morris, G., "An Overview of Off-Line Robot
Programming", Keynote Paper, CIRP Annals, Volume 2, 1986.
Lau, K. and Hocken, R., "Overview of Robot Metrology:, Keynote
Paper, CIRP Annals, Vol. II, 1984.
Zhang, G., Veale, R., Charlton, T., Borchardt, B., and Hocken, R.,
"Error Compensation of Coordinate Measuring Machines", CIRP Annals,
Vol. I, 1985.
Hocken, R. and Nanzetta, P., "Research in Automated Manufacturing at
the National Bureau of Standards", Manufacturing Engineering, 1983.
Simpson, J., Hocken, R., and Albus, J., "The Automated Manufacturing
Research Facility of the National Bureau of Standards", Journal of
Manufacturing Systems, Vol. I, No. 1, 1983.
Horowitz, M. and Hocken, R., "An Inexpensive Laser Interferometer
System:, Precision Engineering, 1983.
Hocken, R. and Nanzetta, P., "Dimensional Metrology at NBS", The
Physics Teacher, 1982.
Cummings, A. and Hocken, R., "An Accurate Temperature Controlled
Polarimeter", Precision Engineering, 1982.
Hocken, R. and Borchardt, B., "On Characterizing Measuring Machine
Geometry", NBSIR 79-1752, May 1979.
Hocken, R. and Layer, H., "Lasers for Dimensional Metrology", CIRP
Annals, 1979.
Hocken, R., Sengers, J.V., Moldover, M., Gammon, R., "Gravity
Effects in Fluids Near the Gas-Liquid Critical Point", Rev. of Mod.
Phys., 1979.
Hocken, R. and Haight, W., "Multiple Redundancy in the Measurement
of Large Structures", CIRP Annals, 1978.
Hocken, R., Simpson, J., Borchardt, B., Lazar, J., Reeve, C., and
Stein, P., "Three Dimensional Metrology", CIRP Annals, 1977
Hocken, R., Sengers, A.L., and Sengers, J.V., "Critical Point
Universality and Fluid", Physics Today, 1977.
Hocken, R., Horowitz, M., and Freer, S., "Critical Anomaly in the
Dielectric Constant of a Nonpolar Pure Fluid", Phys. Rev. Lett.,
1976.
Greer, S. and Hocken, R., "Thermal Expansion Near a Critical
Solution Point", J. Chem Phys., 1975.
Estler, W.T., Hocken, R., Charlton, T., and Wilcox, L., "Coexistence
Curve, Compressibility and the Equation of State of Xenon Near the
Critical Point", Phys. Rev., 1975.
Hocken, R., Moldover, M., Muth, E., and Greer, S., "Versatile Cells
for Optical Studies I Fluids", Rev. Sci. Instr., 1975.
Greer, S., Moldover, M., and Hocken, R., "A Differential Transformer
as a Position Detector in a Magnetic Densimeter", Rev. Sci. Instr.,
1975.
Hocken, R. and Stell, G., "Index of Refraction in the Critical
Region", Phys. Rev., 1973.
Haight, W., Borchardt, B., Hartsock, R., Veale, R., and Hocken, R.,
"Lifting Distortion in Free-Standing LNG Cargo Tanks", NBSIR.
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REFEREED CONFERENCE PROCEEDINGS
Phan, S., Keanini, R., Smith, S., Hocken, R. "Resonance Based
Force Measurement: Prelude to High-resolution Anemometry for Liquid
Metal Flows." Proceedings of the ASME Heat Transfer Division,
International Mechanical Engineering Congress & Exposition, Vol. 4,
ASME 1999, November 14-19, 1999, p. 3.
Hocken, R., ASME/ASNI, “Methods for the Performance Evaluation of
CNC Lathes and Turning Centers,” new standard, B5.57M, approved by
TC 52 of ASME.
Holmes, M., Hocken, R., and Trumper, D., “A Long-range Scanning
Stage Design,” Proc. of ASPE, Volume 14, 1996.
Holmes, M., Trumper, D., and R. Hocken, “Magnetically-suspended
Stage for Accurate Positioning of Large Samples in Scanned Probe
Microscopy.” Proceedings of the MAG ‘98 Industrial Conference and
Exhibition on Magnetic Bearings, August 5-7, 1998, pp. 123-132.
Cloninger, T., Boudreau, B., Raja, J., Hocken, R., Patten, J. and
Chaffin, J. “Near-field Microscopy: A Different Approach to Infrared
Imaging, “ Proceedings of 1994 NSF Design and Manufacturing Systems
Conference, 2, Boston, MA, January 1994.
Hocken, R., and J. Miller, "Nanotechnology in Metrology",
Proceedings of the Fifth International Symposium on Robotics and
Manufacturing, August 14-18, 1994 in Maui, Hawaii.
Hocken, R., “Correlation Methods for Improved Machine Tool
Accuracy,” Proceedings of the ASPE, October 1995.
Babu, U., J. Raja, R. J. Hocken, "Sampling Methods and Substitute
Geometry Algorithms for Measuring Cylinders in Coordinate Measuring
Machines", Proceedings of ASPE 1993 Annual Meeting, Nov. 1993, pp.
70-73.
Boudreau, B., Cloninger, T., Raja, J., Patten, J., and Hocken, R.,
"A Near-Field Scanning Optical Microscope Module", Proceedings of
the 1992 ASPE Annual Conference, Orlando, FL, Oct. 1992.
Howard, L. P., and Hocken, R. J., "An Interferometric Instrument for
the Metrology of Micromechanisms", Proc. ASPE 1991 Ann. Conf., Santa
Fe, NM, Oct. 1991.
Kumaran, S., Fujii, T., Hocken, R., "Simultaneous Measurement of
spindle Error Motions: A Simple and Economical Method", Proc. of
ASPE 1991 Ann. Conf., Santa Fe, NM, Oct. 1991.
Lavigne, C., Miller, J. A., and Hocken, R. J., "A Long Range
STM/AFM", Proc. ASPE 1991 Ann. Conf., Santa Fe, NM, Oct. 1991.
Shelnutt, J.W., Hocken, R.J., Patten, J.A., and Raja, J., "Precision
Engineering at UNC Charlotte", National Conference of Standards Labs
presentation at Boulder, CO, April 1990.
Miller, J. A., and Hocken, R. J., "Scanning Tunneling Microscopy
Bit-making for Use in High Density Memory Chip Applications", Proc.
ASPE 1990 Ann. Conf., Rochester, NY, Sept. 1990.
Lau, K., Hocken, R., and Haight, W., "An Automatic Laser Tracking
Interferometer System for Robot Metrology," Third International
Precision Engineering Conference, 1985, Precision Engineering.
Cummings, A., Coxon, B., Layer, H., and Hocken, R., "Improved 100
Degree S Point and Pol", Proc. of the 1978 Technical Session on Cane
Sugar Refining Research, 1978.
OTHER PROFESSIONAL PUBLICATIONS
Hocken, R., et. al, “Research in Precision Engineering,” Proc. of
1998 NSF Design and Manufacturing Systems Conference, Monterey,
Mexico, pg. 371, January, 1998.
Hocken, R., “Engineering Metrology, a Strategic Manufacturing
Initiative,” Proc. of 1998 NSF Design and Manufacturing Systems
Conference, Monterey, Mexico, pg. 435, January 1998.
Hocken, R., Lucca, D., et. al., “Nanometric Cutting,” Proc. of the
1998 NSF Design and Manufacturing Systems Conference, Monterey,
Mexico, Pg. 436, January 1998.
Trumper, D. Hocken, R., Holmes, M., “Analysis and Design of a
Long-range Scanning Stage,” Proc. of the 1998 NSF Manufacturing
Grantees Conference, Monterey, Mexico, pg. 363, January 1998.
Hocken, R., et. al. “ Research in Precision Engineering,” Proc. of
1997 NSF Design and Manufacturing Systems Conference, Seattle, WA,
Jan. 1997.
Hocken, R., et. al. “Engineering Metrology, a Strategic
Manufacturing Initiative,” Proc. of 1997 NSF Design and
Manufacturing Systems Conference, Seattle, WA, Jan. 1997.
Hocken, R., Lucca, D., et. al., “Nanometric Cutting,” Proc. of 1997
NSF Design and Manufacturing Systems Conference, 2, Seattle, WA,
Jan. 1997.
Hocken, R. ASME/ANSI, “Methods for the Performance Evaluation of CNC
Lathes and Turning Centers,” New Standard B5.57M, approved by B5
Committee of ASME, October 1997.
Holmes, M. Hocken, R., Trumper, D., “A Long-range Scanning Stage,”
Proceedings of the ASPE, Volume 16, pg. 474, 1997.
Hocken, R., Namperumal, R., Pereira, P., Lovingood, J., Edgeworth,
R., Sharma, A., Holmes, M., and Muralikrishan, B., “Design of a
Second Generation Nanometric Cutting Instrument,” Proc. of the ASPE,
Volume 16, pg. 386, 1997.
Wilhelm, R., Srinivasan, N., Farabaugh, F. and Hocken, R.,
“Prediction of Part Form Errors from Machine Tool Measurements:
Experimental Summary,” Transactions of NAMRI/SME, Volume XXV, page
317, 1997.
Hocken, R. and Wilhelm, R., “Frontiers in Precision Manufacturing
Metrology,” International Journal for Manufacturing Science and
Production, 1997.
Hocken, R., et al., “Research in Precision Engineering,” Proceedings
of 1996 NSF Design and Manufacturing Systems Conference, 2, NM, Jan.
1996.
Hocken, R., “Engineering Metrology, a Strategic Manufacturing
Initiative,” Proceedings of 1996 NSF Design and Manufacturing
Systems Conference, 2, NM, Jan. 1996.
Hocken, R., Lucca, D., et. al., “Nanometric Cutting,” Proceedings of
1996 NSF Design and Manufacturing Systems Conference, 2, NM, Jan.
1996.
Boudreau, B.D., Raja, J., Patten, J., and Hocken, R.J., “Scanning
Near-Field Infrared Microscopy,” Proceedings of the 1995 NSF Design
and Manufacturing Grantees Conference, La Jolla, California, January
4-6, 1995.
Hocken, R., Miller, J. Brien, J., Smith, S. Raja, J., Patterson, S.
Patten, J., Shelnutt, W., Babu, U., Lalomia, C. Hurst, P.,
Lechleider, J. and Laksminararayan, S., “Reserach in Precision
Engineering,” Proceedings of the 1995 NSF Design and Manufacturing
Grantees Conference, La Jolla, California, January 4-6, 1995.
Hocken, R., Miller, J., Brien, J., Smith, S., Raja, J., Patterson,
S., Patten, J., Shelnutt, W., Mayes, T., Farahi, F., Badami, V.,
Schmidt, D., Brinegar, P., and Suter, S., “Research in Precision
Engineering,” Proceedings of the 1995 NSF Design and Manufacturing
Grantees Conference, La Jolla, California, January 4-6, 1995.
Cloninger, T., Boudreau, B., Raja, J., Hocken, R., Patten, J. and
Chaffin, J. “Near-field Microscopy: A Different Approach to Infrared
Imaging,” Proceedings of 1994 NSF Design and Manufacturing Systems
Conference, 2, Boston, MA, January 1994.
Hocken, R., J. Miller, J. Brien, S. Smith, J. Raja, U. Babu, S.
Patterson, J. Patten, W. Shelnutt, P. Hurst, D. Trumper, L. Howard,
"Research in Engineering Metrology, A Strategic Manufacturing
Initiative", Proceedings of the 1994 NSF Design and Manufacturing
Systems Grantees Conference, Boston, MA, Jan 5-7, 1994, pp. 425-426.
Hocken, R., J. Raja, S. Patterson, Z. Fang, P. Hurst, W. Shelnutt,
S. Suter, J. Patten, D. Trumper, "Research in Precision
Engineering", Proceedings of the 1994 NSF Design and Manufacturing
Systems Grantees Conference, 2, Boston, MA, Jan 5-7, 1994, pp
427-428.
Boudreau, B., T. Cloninger, J. Raja, R. Hocken, J. Patten,
"Near-Field Infrared Microscopy", 1994 NSF Design and Manufacturing
Systems Grantees Conference, Boston, MA, Jan 5-7, 1994. pp. 409-410.
Lucca, D. A., R. Hocken, S. Balasubramaniam, R. Rhorer, "The
Mechanics of Nanometric Cutting", Proceedings of the 1994 NSF Design
and Manufacturing Systems Conference, January 6-8, 1994, pp.
609-610.
Trumper, R. Poovey, "Research in Precision Engineering", Proceedings
of the 1993 NSF Design and Manufacturing Conference, Charlotte, NC,
January 6-8, 1993, pp. 1585-1590.
Hocken, R., et al, “Software Correction of Precision Machines,”
Final Report to NIST, July 1993.
Cloninger, T., B. Boudreau, J. Raja, R. Hocken, J. Patten, J.
Chaffin, "Near-Field Microscopy: A Different Approach to Infrared
Imaging", Proceedings of the 1993 NSF Design and Manufacturing
Conference, Charlotte, NC, January 6-8, 1993, pp. 1547-1552.
Caskey, G., Hari, Y., Hocken, R., Machireddy, R., Raja, J., Wilson,
R., "Sampling Techniques for Coordinate Measuring Machines",
Proceedings of 1992 NSF Design and Manufacturing Systems Conference,
January 1992.
Boudreau, B., Estrada, H., Hastings, S., Hocken, R., Howard, L.,
"Nanotechnology for Advanced Mass Storage", Proc. of 1992 NSF Design
and Manufacturing Systems Conference, January 1992.
Boudreau, B., Cloninger, T., Raja, J., Patten, J., Hocken, R., "A
Near-Field Scanning Infrared Microscope", Proc. of 1992 NSF Design
and Manufacturing Systems Conference, January 1992
Caskey, G., Hari, Y., Hocken, R., Palanivelu, D., Raja, J., Wilson,
R., "Sampling Techniques for Coordinate Measuring Machines",
Proceedings of the 1991 NSF Design and Manufacturing Systems
Conference, Austin, TX, Jan. 1991.
Hocken, R., "A New National Standard for the Performance of
Coordinate Measuring Machines", Proceedings of the 1991 NSF Design
and Manufacturing Systems Conference, Austin, TX, Jan. 1991.
Estrada, H., Hjellming, L., Hocken, R., et.al., "Nanotechnology for
Advanced Mass Storage- A Strategic Manufacturing Initiative",
Proceedings of the 1991 NSF Design and Manufacturing Systems
Conference, Austin, TX, Jan. 1991.
Hocken, R., et.al, "Methods For Performance Evaluation of Computer
Numerically Controlled Machining Centers", ANSI/ASME B5.54-1991,
Standard for ASME, 1991.
Hayes, D.J., Scott, R.J., Hocken, R.J., Imrhan, S.N., "Precision
Manufacturing Guidelines, A State-of-the-Art Assessment of Human &
Environmental Factors", National Center for Manufacturing Sciences
report, December 21, 1989.
Hocken, R., Shelnutt, W., Miller, J., Thomassen, H., and Westervelt,
P., "Automatic Inspection Systems for Edge and Surface Finishing",
National Center for Manufacturing Sciences report, April 8, 1989.
Hocken, R., "Machine Tool Accuracy", Chairman, Report of Working
Group 1 of the Machine Tool Task Force, UCRL-52960-S, 1980.
Moldover, M., Hocken, R., Gammon, R., and Sengers, J.V., "Overviews
and Justifications for Low Gravity Experiments on Phase Transition
and Critical Phenomena in Fluids", NASA Report Order No. C-62861-C,
1976.
Hocken, R., "NBS Research Associate Program in Ultra-High Precision
Metrology on Behalf of Corning Glass Works", 1976.
Hocken, R., "A Refractive Index Anomaly in Xenon Near its Critical
Point", Ph.D. Thesis, Stony Brook, 1973.
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CHAPTERS IN BOOKS
Cummings, A., Layer, H., and Hocken, R., "Lasers in Analytical
Polarimetry", in Lasers in Chemical Analysis, Juman Press, NJ, 1980.
Hocken, R., “Measurement Integration,” in Coordinate Measuring
Machines and Systems, Marcel Dekker, NY, 1995.
RECENT RESEARCH FUNDING
Principal Investigator
No. 4,714,339, "Three and Five Axis Tracking Systems", Dec. 1987
No. 6,434,845, “Dual-axis Static and Dynamic Force Characterization
Device”
"Laser Polarimetric Roll Detector", submitted, March, 1993
“Stabilized Diode Laser”, submitted 1995
“Fiber Optic White Light Interferometer”, submitted 1997
Miniature CMM probes, submitted 2005
Laser system for large-scale metrology, submitted 2005